Resonant scattering of X-rays at total reflection conditions

Generalized kinematical approach of the resonant scattering at the condition of the total external reflection has been developed and it is shown that the resonant additives to the reflectivity amplitude are modulated in such conditions by the squared total field amplitude. Model calculations show the validity of the developed approach if the resonant additives to the reflectivity amplitude are small enough. The selection of the resonant component of the reflectivity is possible with polarization analyzer of the reflected radiation in the case when the incident radiation is linearly polarized and resonant scattering contains the dichroic component (as e.g. in the case of the magnetic scattering). The results of the measurements of the angular dependencies s®p’ or p®s’ reflectivity and Mössbauer p®s’ reflectivity spectra at different angles are presented, which certify the predicted influence of the X-ray standing waves on the reflectivity with rotated polarization and demonstrate the efficiency of the polarization analysis in the X-ray and Mössbauer reflectometry for the magnetization depth profile investigations in multilayers.