Ion-beam surface treatment of PDMS to improve cell adhesion

The object of the study were samples of pure polydimethylsiloxane (hereinafter PDMS) and cells of the HEK-293 cell line. Experiments were carried out to modify the PDMS surface with beams of atomic and cluster argon ions with energies of 10 keV. Ion beams were directed at angles of $60^\circ$ and $90^\circ$ to the surface of the samples, the radiation fluence ranged from $10^{15}$ to $10^{16}$~ions/cm$^2$. The modified surface was studied by atomic force and optical microscopy methods. The study of cell adhesion was carried out by scanning ion-conducting and optical microscopy. As a result of the study, improving of the conditions for cell adhesion on the surface of PDMS during pretreatment of this surface with a beam of atomic argon ions was demonstrated, and the formation of the microrelief during ion irradiation on the surface of the samples was observed.